Chip Gallery Variability
Designers:
Zheng Guo, Liang-Teck Pang, Andrew Carlson, Kenneth Duong, Ji-Hoon Park, Lauren Jones
Tapeout:
ST 45nm, June 2008
Description:
This testchip contains circuits for characterizing variability of three different SRAM bitcells using large-scale SRAM arrays as wel as padded-out SRAM macros. It also contains variable length ring-oscillators for characterizing the impact of gate stacks and datapath length on variability.
Related publications:
JSSC 2009